温度控制织构金属基带上YBCO外延薄膜生长及缺陷研究

徐亚新, 熊杰, 夏钰东, 张飞, 薛炎, 陶伯万

Effect of Substrate Temperature and Dislocation Density on the Epitaxial Growth of YBCO Thin Films on Textured Metal Tap

XU Ya-Xin, XIONG Jie, XIA Yu-Dong, ZHANG Fei, XUE Yan, TAO Bo-Wan

图5 不同基片温度制备的YBCO薄膜的临界电流密度 J c 77 K, 0 T、螺位错密度 N S 、刃型位错密度 N E 和总位错密度 N
Fig. 5 The critical current density J c 77K,0T, the density of the screw type threading dislocations N S , the edge dislocations N E and the total dislocations N of YBCO thin films prepared at different substrate temperatures