退火温度对Bi3.15(Eu0.7Nd0.15)Ti3O12铁电薄膜力学性能的影响
蒋大洞, 郑学军, 龚跃球, 朱哲, 彭金峰

Effect of Annealing Temperature on the Mechanical Properties of Bi3.15(Eu0.7Nd0.15)Ti3O12 Ferroelectric Thin Films
JIANG Da-Dong, ZHENG Xue-Jun, GONG Yue-Qiu, ZHU-Zhe, PENG Jin-Feng
图7 BENT薄膜的残余应力和晶粒尺寸随退火温度的变化关系
Fig. 7 Residual stress and grain size for BENT thin films as functions of annealing temperature