退火温度对CsI(Tl)薄膜微观结构和闪烁性能的影响
程 峰,钟玉荣2,王宝义,王天民3,魏 龙
Effect of Annealing Temperature on the Microstructure and Scintillation Properties of CsI(Tl) Films
CHENG Feng,ZHONG Yu-Rong,WANG Bao-Yi,WANG Tian-Min,WEI Long
无机材料学报
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2008, (4): 749
-752
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DOI: 10.3724/SP.J.1077.2008.00749
